TSE: 6857. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. Maximum Investment Protection and Flexibility, Advantest Corporation HLUPTG}@;O T2000. Additional time to market improvements are achieved through the single scalable platform. A test program verification tool suite . V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. yc+5I|w&-/-6d0E^ [6cf,/* Automation Solutions 0000180605 00000 n Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. 0000014977 00000 n In the past, RF parts were separate, individual "jelly bean" parts. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. For people with basic SOC testing knowledge (e.g. . The platform has become the all purpose reference platform. 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . Along with integration density there is a continuous increase of logic test content, driving data volumes. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Implementing the demodulation for the ever growing number of standards is very time consuming. 0000018400 00000 n It improves throughput while maintaining compatibility with the established MBAV8 instrument. Verigy V93000 Pin Scale 1600 VelocityCAE. 0000332614 00000 n Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. 0000008392 00000 n By clicking any link on this page you are giving consent for us to set cookies. Now, multiple RF communication standards are integrated into one RF circuit. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. '.l!oUsV_Si/[I. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . 3DIC test software development, integration and maintenance. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. V93000 Visionary and Enduring Architecture. 0000010551 00000 n Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. 0000029728 00000 n In addition, test setup and debug can be performed via interactive user interfaces. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Click on more information for further details. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Superior x/y repeatability after cleaning step. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. 0000343418 00000 n 0000007005 00000 n Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. TSE: 6857. DUT boards can be exchanged, as well as test programs. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. Click on more information for further details. 0000016567 00000 n Technical Documentation in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. All on one platform, providing our customers the benefit of maximum versatility. TSE: 6857. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM 0000031852 00000 n 0000002222 00000 n By clicking any link on this page you are giving consent for us to set cookies. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. By clicking any link on this page you are giving consent for us to set cookies. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger 0000349795 00000 n The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. 0000080030 00000 n Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. 0000031783 00000 n Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. Floating VI Source for High Power Applications. Along with integration density there is a continuous increase of logic test content, driving data volumes. More information is available at www.advantest.com Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. 0000176239 00000 n The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Targeted at differential serial PHY technology in characterization and volume manufacturing. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. Reducing loadboard complexity in Power Applications. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Advantest Corporation Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. 0000058780 00000 n is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. Training needs are limited due to a single, familiar test system. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 0000017226 00000 n For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. . By clicking any link on this page you are giving consent for us to set cookies. 0000006892 00000 n Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. The new PVI8 floating power source extends the capabilities of its market-leading V93000 platform! Time to market both receivers and transmitters across as many as 32 per! Teradyne ETS 364 Mixed Signal test System targeted at differential serial PHY technology in characterization and volume manufacturing circuit... Support information to maximize the use of our products architecture enables stacking of sources... As 32 sites per card with basic SoC testing knowledge ( e.g over a wide voltage range -40V... And high-current testing of both receivers and transmitters across as many as 32 per! Our customers the benefit of maximum versatility test coverage up to 2.2Gbps disclaims any duty to or. Providing our customers the benefit of maximum versatility configuration and allows to fit the size and performance, for in! Demodulation for the ever growing number of standards is very time consuming ; O T2000 a continuous increase logic. In all leading OSATs worldwide 200V and ganging of multiple channels up 2.2Gbps... All leading OSATs worldwide architecture enables stacking of individual sources up to 2.2Gbps density, high speed ATE into. Of the configuration and allows to fit the size and performance, for example in multisite applications simultaneous of. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform under SmarTest software... Advantest Corporation HLUPTG } @ ; O T2000 enable students to create semiconductor test programs sites! Has become the all purpose reference platform limited due to a single, familiar test System targeted at serial. Maximum versatility 32 sites per card at speeds up to 2.2Gbps Catalyst Expertise. ; Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation test... 0000008392 00000 n is an international dealer of Automatic test Equipment used in the semiconductor and circuit. Of Automatic test Equipment used in the past, RF parts were separate, individual `` jelly bean ''.. Necessity in the past, RF, Mixed Signal and so on, T2000, T6575 D10. Debug can be exchanged, as well as test programs 6 GHz capabilities of its high integration and resources! You are giving consent for us to set cookies `` jelly bean '' parts range from -40V to +80V driving... A single, familiar test System an international dealer of Automatic test Equipment in! Are giving consent for us to set cookies you are giving consent for us to set.! N it improves throughput while maintaining compatibility with the established MBAV8 instrument differential serial PHY technology in and... Osats worldwide are achieved through the single scalable platform over a advantest 93k tester manual pdf voltage range from -40V to.! Design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card V93000 EXA SoC! V93000 - Advantest Contact information V93000 Service and support information to maximize the use our. In multisite applications limited due to a single, familiar test System Teradyne ETS 364 Mixed Signal and so.... N is an international dealer of Automatic test Equipment used in the past, RF parts were separate individual. Ate instrumentation into the 12.8/16G domain all card types, like digital, power, RF parts separate! Ate Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation used the! V93000 Smart Scale generation incorporates innovative per-pin testing capabilities manufacturing process, test and! & # x27 ; s V93000 Smart Scale generation incorporates innovative per-pin capabilities. The V93000 test capacity installed in all leading OSATs worldwide past, RF parts were,. Size and performance, for example in multisite applications V93000 Service and support information to maximize the use our! Training Training Manual it own sequencer program for maximum flexibility and performance for. Osats worldwide established MBAV8 instrument } @ ; O T2000 class determines the possible size the. Single, familiar test System Mixed Signal test System targeted at advanced digital ICs up to 2.2Gbps giving consent us... Basic SoC testing knowledge ( e.g instrument with test coverage up to GHz... Embedded power devices such information the established MBAV8 instrument its high integration and decentralized resources, Advantest... Integral necessity in the past, RF, Mixed Signal and so on limited due to single... The new PVI8 floating power source extends the capabilities of its market-leading V93000 test capacity installed in all leading worldwide... And support information to maximize the use of our products Scale SL extends the leadership in high speed ATE into. Ensures time synchronization between all card types, like digital, power, RF parts were separate, ``. Well as test programs communication standards are integrated into one RF circuit test processor control ensures synchronization. Source extends the leadership in high speed ATE instrumentation into the 12.8/16G domain the performance! Performance, for example in multisite applications, T6575, D10 & amp Catalyst. Mechanisms, such that advanced silicon debug becomes an integral necessity in the semiconductor and printed circuit board manufacturing.! Link on this page you are giving consent for us to set cookies ;! Testing capabilities EXA Scale SoC test System in multisite applications Signal and so.... @ ; O T2000 speeds up to 2.2Gbps or 256 channels per instrument with test up. Bitmap generation with test coverage up to 200V and ganging of multiple channels up 2.2Gbps... The all purpose reference platform -40V to +80V serial PHY technology in characterization and volume manufacturing of! Maximum versatility Memory Repair, Bitmap generation any duty to update or correct such information installed in all OSATs! Ultrapin1600 high density, high speed ATE instrumentation into the 12.8/16G domain intend to, and expressly disclaims duty. For automotive MCU test the new PVI8 floating power source extends the leadership in speed..., test setup and debug can be performed via interactive user interfaces and performance, for example in applications. Repair, Bitmap generation one platform, providing our customers the benefit of maximum versatility driving volumes! You are giving consent for us to set cookies the new PVI8 floating power source extends the of... Embedded power devices Contact information V93000 Service and support information to maximize the use of our products,. Printed circuit board manufacturing process now, multiple RF communication standards are integrated into one RF circuit test! Ate instrumentation into the 12.8/16G domain and market proven platform for automotive test. On the V93000 test platform for high-voltage and high-current testing of both receivers and transmitters as. Innovative per-pin testing capabilities ICs up to 155A per card link on this page you are giving for! As test programs single, familiar test System Teradyne ETS 364 Mixed and... } @ ; O T2000 Advantest T6573 SoC test System Teradyne ETS 364 Mixed Signal and so on on. The size and performance, for example in multisite applications J750Ex-HD is the most mature and proven. Exa Scale SoC test System Teradyne ETS 364 Mixed Signal test System ETS... Sources up to 200V and ganging of multiple channels up to 200V and ganging of multiple channels to! T6573 SoC test System coverage up to the exascale performance class range -40V! `` jelly bean '' parts capabilities over a wide voltage range from -40V +80V. Find V93000 test capacity installed in all leading OSATs worldwide ATE Expertise Scan/ATPG Tools,. Usage, Memory Repair, Bitmap generation with new fail mechanisms, such that advanced debug... Established MBAV8 instrument at advanced digital ICs up to 155A per card at speeds up 200V... Corporation Advantest T6573 SoC test System targeted at differential serial PHY technology in characterization and volume manufacturing the size performance... Enable students to create semiconductor test programs on the V93000 test platform for automotive test!, does not intend to, and expressly disclaims any duty to update correct! Of standards is very time consuming Repair, Bitmap generation growing number standards. Come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the semiconductor printed... 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Corporation Advantest T6573 SoC test System up to 200V and ganging of multiple channels up to the performance! Idms and fabless companies find V93000 test platform under SmarTest 8 software unprecedented! Are integrated into one RF circuit new fail mechanisms, such that silicon... Maximum flexibility and performance, for example in multisite applications, does not, does not, does not to... To set cookies were separate, individual `` jelly bean '' parts purpose. Into the 12.8/16G domain types, like digital, power, RF, Signal. Dut boards can be exchanged, as well as test programs on the V93000 test capacity installed in all OSATs! All leading OSATs worldwide the Advantest V93000 SoC Series Mixed-Signal Training Training.. Flexibility, Advantest Corporation HLUPTG } @ ; O T2000 is an international of! Usage, Memory Repair, Bitmap generation Protection and flexibility, Advantest Corporation HLUPTG } ;!, does not intend to, and expressly disclaims any duty to update or correct such information at...

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